| 発表者名 |
渡邉 楓花 |
| 指導教員名 |
福谷 克之 教授 |
| 発表題目(英語) |
Evaluation of Ni thin film and thermal desorption spectroscopy of H2 |
| 要旨(英語) |
Electron spin of a molecule plays an important role in molecular interaction with surfaces. We recently demonstrated that the adsorption probability of a hydrogen atom is spin-dependent on Ni(111) with a spin-polarized hydrogen atom beam using a hexapole magnet [1] [2]. At the Ni(111) surface, the magnetization was in-plane. On the other hand, whereas the magnetization of a Ni thin film is in-plane at Ni thicknesses below 7ML, it is oriented in the perpendicular direction above 7ML [3][4]. We aim to investigate the spin dependence on the adsorption probability on a Ni thin film, where we expect the spin dependence of adsorption changes depending on the Ni thickness. In the present study, we report the growth of Ni thin films on a Cu layer formed on a SrTiO3(100) substrate and adsorption characteristic of H on Ni/Cu(100).
A SrTiO3(100) substrate was annealed at 923 K under oxygen atmosphere at 6.5×10-4 Pa prior to film fabrication. Subsequently, a Cu film was grown in a three-step process. Initial deposition at a substrate temperature of 673 K to grow seeds with an epitaxial orientation, followed by deposition at 373 K to cover full substrate, both at a constant rate of 7Å/min. After that, the sample was annealed at 573 K for 1 hour. The resulting Cu film exhibited a sharp (1×1) LEED pattern. The film grew epitaxially on the SrTiO3 (100) substrate, with its crystallographic orientation aligned accordingly. Following the Cu deposition, a Ni film was deposited at room temperature at a rate of 1 Å/min. LEED observation of this surface showed a R45°(√2 ×√2) pattern. For this Ni film, we performed thermal desorption spectroscopy for spin polarized H beam and H2 gas. In the presentation, the difference between the thin film and bulk adsorption energy would be shown.
[1] Y. Nagaya, et al., J. Chem. Phys. 155, 194201 (2021)
[2] H.Ueta,et al., submitted
[3] Bochi G, et al., Mat. Res. Soc. Symp. Proc. 313 309 (1993)
[4] R.Vollmer, et al., PRB, 60, 9 (1999) |
| 発表言語 |
日本語 |